| iNARTE News Selected On-line Articles Volume 19 Number 2 Summer 2001 |
It never fails. After I test a product, observe susceptibility responses or noncompliant emissions and report my findings to the design team, panic and hysteria immediately erupt. Design engineers grab their "fix-it" kits and rush into the fray. Capacitors, inductors, resistors and ferrite beads are thrown into the mix (design). This reaction is understandable. Electromag-netic compatibility’s (EMC) importance increases as technology advances. One volt interference coupled onto today’s device is just not the same as one volt interference imposed on a vacuum tube device from yesterday. EMC awareness has also grown. Manufacturers, customers and consumers are bombarded with information from the media: Jet crashes blamed on equipment malfunction--experts unable to find reason for crash; unsubstantiated claims of cancer linked to cell phone radiation. Despite the engineer’s best intention for compliance, the design retaliates. It balloons in one direction and then another. The design is defiant to the very end, proving Murphy was a competent EMC engineer!
Traditional Design Engineer vs. EMC Design
Engineer; Separate Problem-solving Approaches
Over the years, I have learned about the difference between
the traditional design engineer and an EMC-competent design
engineer. You may think they are one and the same, but they’re
not. The difference is their approach to an EMC problem and the
time it takes them to design the "fix".
Typically, the design engineer’s approach is to review the
data, interpret the symptoms, and intellectually determine the
"root cause". Then the traditional engineer installs filters here and
there until finding the perfect component mix. The "fix" is then
verified by repeating the test. This process is repeated as often as
necessary until the design meets the objective, compliance.
Alternatively, an EMC-competent design engineer’s method
is to review the data, interpret the symptoms, intellectually determine
possible "root cause(s)," design a set of experiments to
verify the hypothesis and repeat this procedure until all the
variables have been discovered. Understanding the "whole" picture
enables the EMC-competent engineer to provide a low cost-effective
solution.
Avoiding the "Hocus-Pocus"EMC Test Event
Given the two different methods, one may believe the typical
design engineer’s approach is acceptable. It appears to achieve the
objective quicker and everyone knows the importance of meeting
schedules.
However, we must keep in mind what I call the hocus-pocus
EMC event. Adding a capacitor here, installing a bead there, leads
to achieving compliance over the suspect frequency range. Full
frequency testing shows the noncompliance event has moved
down the block and has invited family. This process is repeated
over and over. Eventually, one loses count and sight over the
components that finally made compliance a reality.Testers/engineers
do not have time to remove unnecessary components and
retest. The product cost consequently sky rockets. So we, EMC
engineers and technicians, must effectively assist (mentor) engineers
on how to troubleshoot their designs. We can’t afford just to
conduct the test, document our findings and make recommendations
to the design team. We must actively support design engineers
to ensure they follow a systematic approach for problem
solving.
Three Trouble-Shooting Blocks For Finding
Cost/Time Effective Solution
There are three major troubleshooting blocks for finding a
cost/time effective solution: Analysis; background investigation;
and corrective action.
Block 1:ANALYSIS
The basic analysis steps appear below.
Is there a different test or another method you can perform to
verify a device’s fault condition? For example, a radiated immunity
test could be substituted for a conducted immunity bulk
current injection test, depending on the symptom frequency range
or vice versa. Similarly, the conducted emissions current probe
method could be substituted for the radiated emissions, depending
on the symptom frequency range. Different test methods provide
a better understanding of the coupling mechanisms involved and
provide clues to the type of fixes required.
Does the failure mode change if you change the device’s loads
from minimum to maximum and/or change the device’s operational
parameters? Different configurations will indicate coupling
mechanisms. Listen to the data.
Keep in mind the device’s block diagram. It will aid your
understanding of the circuitry and how individual circuits interact.
Use the block diagram to develop fault isolation experiments.
Perform experiments in order to isolate and determine the root
cause. I uncovered a radiated immunity problem while testing a
prototype ignition module. After talking with the software and
hardware design engineers, we opted to isolate the microprocessor’s
inputs and created special microprocessor software, then programmed an EEPROM.
The "special" microprocessor software
disabled all interrupts and generated a fire signal every 50 milliseconds.
There were three functional blocks left in the module:
voltage regulator, reset circuitry and our special microprocessor.
I conducted an RF sweep and recorded the results. Next, I enabled
one interrupt and its associated input signal, then repeated the RF
sweep and recorded the results. This process was repeated until
all input signals and associated interrupts were enabled. We
thereby quickly discovered the "root cause" and corrected the
issue prior to production.
Block 3:CORRECTIVE ACTION
Wait for the "new improved version", then retest. Compliant
test results closes this item. Noncompliance observations during
verification testing starts the process all over.
Summary
It sounds simple, but executing the ABCs within a design
schedule is a challenge. It is always easier to say how to do it rather
than just doing it, especially when the fires are raging.
When Program Managers and customers demand the solution
overnight (at no additional cost), everyone is pulling their hair,
gnashing their teeth and praying that the next experiment will
show the root cause.